May 22 - May 23
X-ray Metrology Workshop (XRM)
We are pleased to announce that the X-ray metrology workshop (XRM) is becoming a good tradition in the Netherlands. The XRM 2018 will be organized at the Utrecht University (The Netherlands) from 22nd till 23rd of May 2018.
Scope of the workshop
This year we are planning to focus on the quantitative analysis of spectroscopic and diffraction X-ray data. The workshop will take two days. During the first day we will divide the workshop in parallel sessions focused on three aspects of material characterization:
Microstructure and nano-geometry: X-ray diffraction and scattering;
Spectroscopic analysis of chemical composition: EXAFS and XRF;
Thin films characterization: X-ray reflectivity and X-ray standing waves.
During these sessions you will obtain hands-on experience with the analysis of data of the respective techniques.
During the second day a set of lectures with examples of X-ray characterization techniques will be given.
We gladly invite PhD students and young researchers who develop and use analytical techniques as well as researchers who are using X-rays as a daily analysis tool in their research but are not necessary specialized in X-ray science.
150 Euros for both days, free for invited speakers. Seats are limited so, register now!
April 15: deadline for the registration of posters
April 20: confirmation of the workshop program
May 22-23: workshops
For further information, registration and abstract submission:
The X-ray metrology workshop is organized by:
Florian Meirer (UU), Frank de Groot (UU), Igor Makhotkin (UT), Andrei Petoukhov (UU).
Malvern Panalytical, MCEC
- X-ray Metrology Workshop (XRM)
- Utrecht University, Utrecht, the Netherlands
- 22 May 2018, 00:00 - 23 May 2018, 00:00
- UTC+01:00 Europe/Amsterdam